14:00 - 14:40
INVITED SPEAKER: PIERRE BLONDY, XLIM, France
Advances in RF-MEMS Reliablility for Space-Borne Applications
P. Blondy

14:40 - 15:00
Reliability of BiCMOS embedded MEMS Varactors for Wideband RF VCO Applications
M. Wietstruck, G. Kahmen, A. Goeritz, S. Tolunay, B. Tillack and M. Kaynak

15:00 - 15:20
A double closed loop for simultaneous control of dielectric charge and device capacitance in contactless capacitive MEMS
S. Gorreta, J. Pons-Nin and M. Domínguez-Pumar

15:20 - 15:40
On RF Power Calibration of Vector Network Analyzers at the wafer-level
Y. Mikhailov, W. Perndl and A. Rumiantsev